High magnification imaging and microanalysis laboratory

• JEOL 840A Scanning electron microscope with digital secondary and backscattered electron imaging capabilities, energy dispersive spectrometer and color-cathodoluminescence detector (SEM-CL)
• JEOL JXA-733 Electron microprobe with four automated wavelength dispersive spectrometers, digital secondary and backscattered electron imaging capabilities and energy dispersive spectrometer.